Atomic‐Scale Manipulation and In Situ Characterization with Scanning Tunneling Microscopy
نویسندگان
چکیده
منابع مشابه
In-situ scanning tunneling microscopy of the semiconductor-electrolyte interface
The great reactivity o f semiconductor surfaces and the easy formation o f oxide layers make in-situ STM imaging o f tlie semiconductors/electrolyte interface difficult at a high resolution. Additionally, STM imaging o f such interfaces requires some care as far tunneling conditions are concerned. The paper analyses this question with the system SiINaOH to illustrate the latest advances concern...
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The invention of the scanning tunneling microscope was a singularity event in the field of surface science and condensed matter physics. The ability to visualize individual atoms in an atomic structure was a huge step forward in experimental development, one for which the inventors were awarded the Nobel Prize in Physics in 1986. While a groundbreaking development, the Scanning Tunneling Micros...
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ژورنال
عنوان ژورنال: Advanced Functional Materials
سال: 2019
ISSN: 1616-301X,1616-3028
DOI: 10.1002/adfm.201903770